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IEC60884-1 Test Probes

 
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Description The probes are designed according to IEC60884-1 figure 9 and figure 10. Model PG-TP884

IEC60884-1 Test Probes

1. Introduction

The probes are designed according to IEC60884-1 figure 9 and figure 10. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection.


2. Parameter

20N Push force

Rigid steel wire

Diameter: 3+0.03mm, length: 80±0.5mm

Tip of rigid steel wire

R0.2+0.05

1N Push Force

Rigid steel wire

Diameter: 1+0.015mm, length: 80±0.5mm

Tip of rigid steel wire

R0.05


Contact us

PEGO ELECTRONICS (YI CHUN) CO., LTD.

ADDRESS: No. 429, Yichun South Road ( Happiness Park),   Yuanzhou District, Yichun, Jiangxi, 336000, China

E-MAIL: sales@pegotester.com, salesHK@pegotester.com

              service@pegotester.com

WEB: https://www.pegotester.com h‍ttps://www.pegotesters.com

TEL: 86-(0)795-3560528   FAX: 4008266163 ext. 29929

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