IEC60950-1 Test Probe Kits
1. Introduction
The test probe kits are meet the requirement of IEC60950-1, includes jointed test finger, test pin, unjointed test finger, TNV test probe and wedge probe, they are applied to test the person’s protection from live parts and hazardous parts of information technology equipment.
2. Specification
Name | Figure number | Parameter |
Jointed test finger (test probe B) | IEC60950-1 figure 2A IEC61032 figure 2 | Purpose:Protection of person’s finger from live parts Specification: 1). Diameter of dactylogryposis: Φ12mm 2). Length of dactylogryposis: 80mm 3). Diameter of baffle. Φ50mm 4). Length of baffle: 100mm |
Test pin (test probe 13) | IEC60950-1 figure 2B IEC61032 figure 9 | Purpose: Protection against access to hazardous live parts in class 0 equipment and class II equipment Specification: 1). Diameter: Φ3mm (head), Φ4mm (tails) 2). Length of probe: 15mm 3). Diameter of baffle: Φ25mm 4). Thickness of baffle: 4mm |
Test probe | IEC60950-1 figure 2C | Purpose: Protection against access to bare parts of TNV circuits. Specification: 1). Diameter of the probe: Φ12mm 2). Length of the probe: 80mm 3). Diameter of baffle: Φ50mm 4). Thickness of baffle: 5mm |
Straight unjointed test finger with 30N force (test probe 11) | IEC60950-1 clause 2.1.1.1 IEC61-32 figure 7 | Purpose: protection of persons against access to hazardous parts Specification: the size is as same as test probe B, but without joints, 30N force is applied. |
Wedge probe | IEC60950-1 figure EE.1 and EE.2 | Purpose:protection from contact hazardous moving parts, including the shredding rollers/mechanisms. Specification: 1). Diameter of the probe: Φ50mm 2). Length of the probe: 300mm 3). Length of first tip: 30mm 4). Length of second tip: 60mm 5). Length of third tip: 100mm |
