Category
Product Detail
Share to:

Low Temperature Impact Test Device

 
Detail
Description Low temperature impact test device can meet the requirements of IEC60884-1 figure 27 and figure 42, VDE0620 and etc. Model PG-LTID

Low Temperature Impact Test Device

1. Introduction

Low temperature impact test apparatus is designed to meet the test requirements of IEC60884-1 clause 30.4 figure 27 & figure 42, IEC60811-1-4, VDE0620, GB2951.4, GB2099.1 clause 24.4 and 30.4 figure 27 & figure 42 and etc.. It is applied to do the impact test under the condition of low temperature for cord, cable and flexible wire with PE sheath, and flexible wire without PE sheath. This device should work with low temperature chamber and it should be placed on a 40mm thick sponge rubber pad.


2. Specification

Station

1

Falling weight (g)

100*1, 200*1, 300*1, 400*1, 500*1, 600*1, 750*1, 1000*1, 1250*1, 1500*1

Falling impact height (mm)

100

Steel block

Φ20, bottom arc: R300, 100g

Release mode

Manual, mechanical release


Table 1:Fixed cable samples, the falling weight used in test specified in below tables:

OD mm

Falling weight

(g)

>

<&=

-

4.0

100

4.0

6.0

200

6.0

9.0

300

9.0

12.5

400

12.5

20.0

500

20.0

30.0

750

30.0

50.0

1000

50.0

75.0

1250

75.0

-

1500

Table 2:Samples of soft cable, soft wire and communication cable, the falling weight should be specified in below table:

OD mm

Falling weight

(g)

>

< & =

Flat cord

100

-

6.0

100

6.0

10.0

200

10.0

15.0

300

15.0

25.0

400

25.0

35.0

500

35.0

-

600


Contact us

PEGO ELECTRONICS (YI CHUN) CO., LTD.

ADDRESS: No. 429, Yichun South Road ( Happiness Park),   Yuanzhou District, Yichun, Jiangxi, 336000, China

E-MAIL: sales@pegotester.com, salesHK@pegotester.com

              service@pegotester.com

WEB: https://www.pegotester.com h‍ttps://www.pegotesters.com

TEL: 86-(0)795-3560528   FAX: 4008266163 ext. 29929

WhatsApp / Wechat: +86-189 7955 4054

CS
 
 
website qrcode

Mobile Website