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Test Probe A for IP1X Testing (Φ50 sphere with handle)

 
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Description Test probe A meets the requirements of the IEC61032 figure 1 and IEC60529 IP1X Model PG-TPA

Test Probe A for IP1X Testing: Φ50 sphere with handle

1. Introduction:

Test probe A ( Φ50 sphere with handle) is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts


Test probe A with 50N force is means for the protection of persons back of hand from hazard parts.


2. Specification

Diameter of test sphere:

50mm

Diameter of baffle:

50mm

Thickness of baffle:

4mm

Diameter of handle:

10mm

Length of handle:

100mm

Thruster (optional) :

50N

Material: insulating material (handle and baffle), metal (test sphere)


3. IP code Test Probe Kits:

Test Probe A for IP10 Testing: Φ50 sphere with handle

Test Probe B for IP20 Testing: jointed test finger

Test probe C for IP30 Testing: Φ2.5 rod-length 100

Test Probe D for IP40 Testing: Φ1.0 wire-length 100

Test Probe 1 for IP10 Testing: 500g steel sphere

Test Probe 2 for IP20 Testing: 15g steel sphere



Contact us

PEGO GROUP (HK) COMPANY LIMITED

Address:   Flat/RM803, Chevalier House,45-51 Chatham Road South, Tisim Sha Tsui,Kowloon, Hong Kong

E-MAIL: salesHK@pegotester.com

WEB: http://www.pegotester.com/   

          http://www.electricalsafety-testequipment.com/


PEGO ELECTRONICS (YI CHUN) CO., LTD.

ADDRESS: No. 429, Yichun South Road ( Happiness Park),   Yuanzhou District, Yichun, Jiangxi, 336000, China

E-MAIL: sales@pegotester.com, service@pegotester.com

TEL: 86-(0)795-3560528   FAX: 4008266163 ext. 29929

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