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Test Probe B for IP2X testing ( Jointed Test Finger )

 
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Description Test probe b is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. Model PG-TPB

Test Probe B for IP2X testing ( jointed test finger )

1. Introduction:

Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2.

Test probe B with 10N force is for IP2X testing, it means for the protection of persons finger from hazard parts.


2. Specification

Diameter of dactylogryposis:

12mm

Length of dactylogryposis:

80mm

Diameter of baffle:

50mm

Length of baffle:

100mm

Thruster (optional)

10N

Material: Insulating material (baffle and handle), metaldactylogryposis


3. IP code Test Probe Kits:

Test Probe A for IP10 Testing:Φ50 sphere with handle

Test Probe B for IP20 Testing: jointed test finger

Test probe C for IP30 Testing: Φ2.5 rod-length 100

Test Probe D for IP40 Testing:Φ1.0 wire-length 100

Test Probe 1 for IP10 Testing: 500g steel sphere

Test Probe 2 for IP20 Testing: 15g steel sphere


Contact us

PEGO GROUP (HK) COMPANY LIMITED

Address:   Flat/RM803, Chevalier House,45-51 Chatham Road South, Tisim Sha Tsui,Kowloon, Hong Kong

E-MAIL: salesHK@pegotester.com

WEB: http://www.pegotester.com/   

          http://www.electricalsafety-testequipment.com/


PEGO ELECTRONICS (YI CHUN) CO., LTD.

ADDRESS: No. 429, Yichun South Road ( Happiness Park),   Yuanzhou District, Yichun, Jiangxi, 336000, China

E-MAIL: sales@pegotester.com, service@pegotester.com

TEL: 86-(0)795-3560528   FAX: 4008266163 ext. 29929

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