Test Probe B for IP2X testing ( jointed test finger )
1. Introduction:
Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The test probe B is a IP code probe to verify the accessibility of hazardous parts protected by enclosure. The probe can work with a fore gauge to apply approriately force, and work with control panel to form a continuity indicating circuit. User also can select the probe built-in thruster to apply force directly.
2. Specification
Diameter of dactylogryposis: | 12mm | Length of dactylogryposis: | 80mm |
Diameter of baffle: | 50mm | Length of baffle: | 100mm |
Thruster (optional) | 10N |
Material: Insulating material (baffle and handle), metal(dactylogryposis) |
3. IP code Test Probe Kits:
Test Probe A for IP10 Testing:Φ50 sphere with handle
Test Probe B for IP20 Testing: jointed test finger
Test probe C for IP30 Testing: Φ2.5 rod-length 100
Test Probe D for IP40 Testing:Φ1.0 wire-length 100
Test Probe 1 for IP10 Testing: 500g steel sphere
Test Probe 2 for IP20 Testing: 15g steel sphere